Development of Measurement and Data Acquisition Setup Using Lab VIEW for Sample Characterization up to Cryogenics Temperature

摘要

In this paper, we present an indigenously developed automated measurement setup comprising of three modules, using LabVTEW software in CSIR-NPL. The first module deals with differential measurements of any thin films, devices, elements, etc., under different magnetic field environment. Differential measurements provide analysis of individual slope of an I-V curve. The second is to measure the I-V (current-voltage) characteristics of any element or devices. The third module consists of a setup that can be used to measure the I-V characteristics of thin films, semiconductor devices, etc., from room to cryogenics temperature. Some of the results obtained using these softwares had been reported in this paper. Also the setup had been validated. The paper encourages the use of virtual instrumentation for accurate and fast measurements.