首页> 外文会议>SPIE Advanced Lithography Conference >Pin Routability and Pin Access Analysis on Standard Cells for Layout Optimization
【24h】

Pin Routability and Pin Access Analysis on Standard Cells for Layout Optimization

机译:用于优化布局的标准单元的引脚可布线性和引脚访问分析

获取原文

摘要

At advanced process nodes, especially at sub-28nm technology, pin accessibility and routability of standard cells has become one of the most challenging design issues due to the limited router tracks and the increased pin density. If this issue can't be found and resolved during the cell design stage, the pin access problem will be very difficult to be fixed in implementation stage and will make the low efficiency for routing. In this paper, we will introduce a holistic approach for the pin accessibility scoring and routability analysis. For accessibility, the systematic calculator which assigns score for each pin will search the available access points, consider the surrounded router layers, basic design rule and allowed via geometry. Based on the score, the '"bad" pins can be found and modified. On pin routability analysis, critical pin points (placing via on this point would lead to failed via insertion) will be searched out for either layout optimization guide or set as OBS for via insertion blocking. By using this pin routability and pin access analysis flow, we are able to improve the library quality and performance.
机译:在先进的工艺节点上,尤其是在低于28nm的技术上,由于有限的路由器走线和增加的引脚密度,标准单元的引脚可及性和可布线性已成为最具挑战性的设计问题之一。如果在单元设计阶段无法找到并解决此问题,则在实现阶段很难解决引脚访问问题,从而降低布线效率。在本文中,我们将介绍一种用于引脚可及性评分和可布线性分析的整体方法。为了实现可访问性,为每个引脚分配分数的系统计算器将搜索可用的访问点,考虑包围的路由器层,基本设计规则以及允许的几何形状。根据分数,可以找到并修改“不良”引脚。在引脚可布线性分析中,关键引脚点(在该点上放置会导致通孔插入失败)将被搜索出来,以获取布局优化指南,或者将其设置为OBS进行通孔插入阻塞。通过使用此引脚布图能力和引脚访问分析流程,我们能够提高库的质量和性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号