Patterned-electron-beam magnetic tomography technique for observing a magnetic field distribution generated by a magnetized material

摘要

We have previously reported a technique for mapping a magnetic field distribution over the air-bearing surface of a recording head [1][2]. This technique uses a modified transmission electron microscopy and computer processing to produce a three-dimensional intensity profile of a magnetic head field. We have improved the magnetic sensitivity of this technique in order to analyze a magnetic vector distribution generated by a sub-micrometer-square area of a magnetized material.