Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using X-ray scattering and X-ray reflectivity

摘要

CoCrPt films with Ti underlayer have been widely investigated as candidate media for perpendicular recording. The growth of Co alloy is interfacially controlled by the Ti underlayer. Although the engineering effects of Ti underlayer with magnetic properties of CoCrPt film are known, a combined understanding of the effects of crystallographic texture and interface roughness of CoCrPt/Ti films on magnetic properties is yet unclear.