Drawing on a recent study, sponsored by the UK MoD, this paper provides details of a compile-time approach to the implementation of an IEEE Std. 1641 [1] test program (in contrast to previous implementations, which have adopted a run-time approach). Consideration is given to methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with the general run-time approach [3], in terms of portability and validation. As a detailed view of this particular aspect of a 1641 implementation, this paper incorporates the example tests; Gain and 1 dB Compression Point, for a mobile communications device. These tests are defined using the Standard's Test Signal Framework (TSF); test programs are produced using the TSFs in the C# carrier language; IEEE ATML Test Station and Instrument Description are created and used to determine suitable test resources; and, an XML document is created and used to create a translation from the IEEE 1641 & TSF defined test instructions to the test resources' IVI driver calls; this process effectively 'compiling' the C#, IEEE 1641 test program into an IVI test program (in this case, the native driver framework for the test platform).
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