To Upgrade My ATE or Not to Upgrade: That is the Question, New Approaches to Migrating ATE

摘要

In electronics today one thing stays constant, change. It seems that every day somebody is pushing the limits of what to expect next out of the phone we talk on, the computer we use to do our day job, the equipment our soldier are protecting us with. As electronic system technology becomes more complex, it becomes more difficult to assure customer satisfaction. Carefully planned instrumentation migration and modernization can maximize test-system efficiency, performance and quality - and provide meaningful cost savings. There are certainly risks associated with test program set (TPS) migration and modernization. The decision to forego modernization also carries a variety of risks. Ultimately, the decision to refresh outdated technology can provide meaningful cost reductions in areas such as the number of test sets, system throughput, and calibration, maintenance and repair. This paper will explore ways you can mitigate the risks of migration by applying proven success factors.