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SOLR Calibration Using Planar Offset Short in Free-space Material Measurement

机译:Solr校准在自由空间材料测量中使用平面偏移量短

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Electrical properties of materials are requisite to analysis and design electromagnetic (EM) devices and systems. Free-space material measurement method, where the measurand is the free-space scattering parameters of an MUT (Material Under Test) located at the middle of transmit (Tx)/receive (Rx) antennas, is suitable for non-destructively testing the MUT without prior machining and physical contact in high frequencies. This paper proposes a free-space SOLR (Short-Open-Load-Reciprocal or unknown thru) calibration method using three planar offset shorts with the respective offset of (0, λ/6, 2λ/6) for calibrating a free-space material measurement system and measurement results of a glass plate of 4.775 mm thickness are shown in W-band (75–110 GHz).
机译:材料的电气性质是分析和设计电磁(EM)器件和系统的必要条件。自由空间材料测量方法,其中测量是位于传输(TX)/接收(RX)天线的MUT的自由空间散射参数(被测物质),适用于不破坏性地测试MUT没有先前的加工和高频率的物理接触。本文提出了一种使用三个平面偏移短路的自由空间索尔(短开载 - 互换或未知的ACRU)校准方法,其相应的偏移(0,λ/6,2λ/ 6),用于校准自由空间材料测量系统和4.775mm厚度的玻璃板的测量结果如W波段(75-110GHz)所示。

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