Texture analysis integrated to infrared light sources for identifying high fringe concentrations in digital photoelasticity

摘要

In digital photoelasticity images, regions with high fringe densities represent a limitation for unwrapping the phase in specific zones of the stress map. In this work, we recognize such regions by varying the light source wavelength from visible to far infrared, in a simulated experiment based on a circular polariscope observing a birefringent disk under diametral compression. The recognition process involves evaluating the relevance of texture descriptors applied to data sets extracted from regions of interest of the synthetic images, in the visible electromagnetic spectrum and different sub-bands of the infrared. Our results show that extending photoelasticity assemblies to the far infrared, the stress fields could be resolved in regions with high fringe concentrations. Moreover, we show that texture descriptors could overcome limitations associated to the identification of high-stress values in regions in which the fringes are concentrated in the visible spectrum, but not in the infrared.