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Continuous palladium-based thin films for hydrogen detection

机译:用于氢检测的连续钯基薄膜

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Metallic films of palladium (Pd) and palladium-tin (Pd-Sn) have been deposited by evaporation technique. They were used as sensitive material for optical sensor by measuring the variation of absorbance. All samples were then oxidized by annealing at 500°C in low vacuum atmosphere. All the films were investigated by X-Ray Diffraction (XRD), Atomic Force Microscopy (AFM) to observe the influence of the structure and morphology on the optical properties of the films, carrying useful information for the sensing properties of the different sensing materials. Furthermore, the sensing performances were tested by monitoring the variation on the optical absorbance induced during the absorption / desorption of hydrogen gas. While the use of Pd for gas sensing has been widely covered for electrical and SPR sensors, this work aims to extend our comprehension of the optical sensing behavior, especially in absorbance-mode, of the thin films of PdO, Pd-Sn and PdO-SnO_2.
机译:钯(Pd)和钯锡(Pd-Sn)的金属膜已经通过蒸发技术沉积。通过测量吸光度的变化,它们被用作光学传感器的敏感材料。然后通过在低真空气氛中在500°C退火将所有样品氧化。通过X射线衍射(XRD),原子力显微镜(AFM)研究了所有薄膜,以观察结构和形态对薄膜光学性能的影响,并为不同传感材料的传感特性提供了有用的信息。此外,通过监测在氢气的吸收/解吸过程中引起的光吸收率的变化来测试感测性能。尽管Pd用于气体传感已广泛应用于电气和SPR传感器,但这项工作旨在扩展我们对PdO,Pd-Sn和PdO-薄膜的光学传感行为(特别是在吸收模式下)的理解。 SnO_2。

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