首页> 外文会议>International Conference on Solid State Lighting and Led-based Illumination Systems >Measuring the temperature of high-luminous exitance surfaces with infrared thermography in LED applications
【24h】

Measuring the temperature of high-luminous exitance surfaces with infrared thermography in LED applications

机译:在LED应用中使用红外热像仪测量高光出射表面的温度

获取原文
获取外文期刊封面目录资料

摘要

Recently, light-emitting diode (LED) lighting systems have become popular due to their increased system performance. LED lighting system performance is affected by heat; therefore, it is important to know the temperature of a target surface or bulk medium in the LED system. In-situ temperature measurements of a surface or bulk medium using intrusive methods cause measurement errors. Typically, thermocouples are used in these applications to measure the temperatures of the various components in an LED system. This practice leads to significant errors, specifically when measuring surfaces with high-luminous exitance. In the experimental study presented in this paper, an infrared camera was used as an alternative to temperature probes in measuring LED surfaces with high-luminous exitance. Infrared thermography is a promising method because it does not respond to the visible radiation spectrum in the range of 0.38 to 0.78 micrometers. Usually, infrared thermography equipment is designed to operate either in the 3 to 5 micrometer or the 7 to 14 micrometer wavelength bands. To characterize the LED primary lens, the surface emissivity of the LED phosphor surface, the temperature dependence of the surface emissivity, the temperature of the target surface compared to the surrounding temperature, the field of view of the target, and the aim angle to the target surface need to be investigated, because these factors could contribute towards experimental errors. In this study, the effects of the above-stated parameters on the accuracy of the measured surface temperature were analyzed and reported.
机译:近来,发光二极管(LED)照明系统由于其提高的系统性能而变得流行。 LED照明系统的性能受热量影响;因此,了解LED系统中目标表面或整体介质的温度非常重要。使用侵入性方法对表面或块状介质进行原位温度测量会导致测量误差。通常,在这些应用中使用热电偶来测量LED系统中各个组件的温度。这种做法会导致严重的错误,特别是在测量具有高发光度的表面时。在本文提出的实验研究中,使用红外热像仪代替温度探头来测量具有高发光率的LED表面。红外热成像是一种有前途的方法,因为它对0.38到0.78微米范围内的可见辐射光谱没有响应。通常,红外热成像设备被设计为在3至5微米或7至14微米的波段内工作。为了表征LED主透镜,LED荧光粉表面的表面发射率,表面发射率的温度依赖性,与周围温度相比的目标表面温度,目标的视场以及相对于目标物镜的瞄准角需要研究目标表面,因为这些因素可能会导致实验误差。在这项研究中,分析并报告了上述参数对表面温度测量精度的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号