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Temperature effects on the performances of the ATHENA X-IFU thermal filters

机译:温度对雅典娜X-IFU热过滤器性能的影响

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The X-Ray Integral Field Unit (X-IFU) detector on-board ATHENA is an array of TES micro-calorimeters that will operate at ~50 mK. In the current investigated design, five thermal filters (TF) will be mounted on the cryostat shields to attenuate IR radiative load and avoid energy resolution degradation due to photon shot noise. Each filter consists of a thin polyimide film (~50 nm thick) coated with aluminum (~30 nm thick). Since the TF operate at different temperatures in the range 0.05-300 K, it is relevant to study how temperature affects their mechanical/optical performances (e.g. near edge absorption fine structures of the atomic elements in the filter material). Such results are crucial for the proper design of the filters as well as to establish the calibration program operating temperatures. We report the preliminary results of visual inspections performed on test filters of polyimide/Al at different pressure and temperature conditions, IR transmission measurements (1-15 μm) performed in the temperature range 10-300 K, and X-ray Absorption Spectroscopy measurements (175-1650 eV) performed in the temperature range 130-300 K.
机译:ATHENA板上的X射线积分场单元(X-IFU)检测器是TES微量热仪的阵列,其工作频率约为50 mK。在当前研究的设计中,五个恒温滤波器(TF)将安装在低温恒温器护罩上,以衰减IR辐射负载并避免由于光子散粒噪声而导致能量分辨率下降。每个滤光器由一层涂有铝(约30 nm厚)的聚酰亚胺薄膜(约50 nm厚)组成。由于TF在0.05-300 K的不同温度下工作,因此研究温度如何影响其机械/光学性能(例如过滤材料中原子元素的近边缘吸收精细结构)非常重要。这样的结果对于滤波器的正确设计以及建立校准程序的工作温度至关重要。我们报告了在不同压力和温度条件下对聚酰亚胺/ Al滤光片进行目视检查,在10-300 K温度范围内进行的IR透射测量(1-15μm)和X射线吸收光谱测量的初步结果( 175-1650 eV)在130-300 K的温度范围内执行。

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