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The Quality Detection of Surface Defect in Dispensing Dack-End Based on HALCON

机译:基于HALCON的点胶端部表面缺陷的质量检测。

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摘要

This paper proposes a quality detection method of LED surface defects in dispensing back-end based on computer vision library HALCON. The key steps mainly include image preprocessing, image matching and defect detection, etc. Firstly, to choose the matching area automatically according to the regional characteristics of the LED chip. Secondly, image matching with standard template. Finally, complete defect detection using the improved matching algorithm. The method can select matching area automatically from the collection of image with CMOS. It can complete image matching quickly and accurately, and detect the defect effectively.
机译:提出了一种基于计算机视觉库HALCON的点胶后端LED表面缺陷的质量检测方法。关键步骤主要包括图像预处理,图像匹配和缺陷检测等。首先,根据LED芯片的区域特性自动选择匹配区域。其次,将图像与标准模板进行匹配。最后,使用改进的匹配算法完成缺陷检测。该方法可以从具有CMOS的图像收集中自动选择匹配区域。它可以快速,准确地完成图像匹配,并有效地检测出缺陷。

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