首页> 外文会议>International SoC Design Conference >A transient enhanced external capacitor-less LDO with a CMOS only sub-bandgap voltage reference
【24h】

A transient enhanced external capacitor-less LDO with a CMOS only sub-bandgap voltage reference

机译:具有仅CMOS子带隙基准电压源的瞬态增强型外部无电容LDO

获取原文

摘要

This paper presents an external capacitor-less low-dropout(LDO) regulator with a voltage spike detection circuit for the enhanced transition response and with a CMOS only sub-bandgap voltage reference(BGR) operated in subthreshold region. CMOS sub-BGR adopted a weighted Vgs structure and a body bias technique for reducing the variations from process, voltage and temperature (PVT). The proposed LDO achieved the PSRR of -96dB at DC and -34dB at 1MHz by using 3-stage configuration. The proposed LDO operates with the reference voltage of 283mV from the Sub-BGR and provides the output voltage of 1.5V. Simulated results shows that overshoot and undershoot of output voltage were reduced to 62mV and 56mV respectively when the load current changes from 0 to 50mA. Total power consumption was 60μA and the chip area was 0.03358mm2 with 0.18μm CMOS process.
机译:本文提出了一种外部无电容低压差(LDO)稳压器,该稳压器具有电压尖峰检测电路以增强转换响应,并在亚阈值区域内使用仅CMOS的子带隙基准电压(BGR)。 CMOS sub-BGR采用加权Vgs结构和体偏置技术,以减少工艺,电压和温度(PVT)的变化。拟议的LDO通过使用三级配置,在DC时达到-96dB的PSRR,在1MHz时达到-34dB的PSRR。拟议的LDO在Sub-BGR的参考电压为283mV的条件下工作,并提供1.5V的输出电压。仿真结果表明,当负载电流从0变为50mA时,输出电压的过冲和下冲分别降低至62mV和56mV。采用0.18μmCMOS工艺时,总功耗为60μA,芯片面积为0.03358mm2。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号