Fault Localization Method by Utilizing Memory Map and Input-Driven Update Interval

摘要

As the importance of automotive ECU (Electronic Control Unit) and its software increase, the systematic testing method is applied to them. However, it takes a lot of time to localize the faults because the developers have not been enough information which can be used for debugging by the nature of the test process for the automotive software. In this paper, we propose a method to reduce the fault-suspicious region in the memory by utilizing the memory map and the correlation between the inputs and the update information. As a preliminary result, we confirmed that the fault-suspicious region is reduced to 17.42(%) of the memory size by using the proposed method.