Platform IO and system memory test using L3 cache based test (CBT) and parallel execution of CPGC Intel BIST engine

摘要

As the memory industry pushes to increase memory density, device variation is creating more defects. Furthermore, new form factors (phone, tablet, mobile and client PC) and low cost board and platform limits physical access to JTAG or TAP. Taking advantage of the x86 architecture's high functional bandwidth to memory, the quickest way to access and test memory is through CPU core, by storing and running parallel CPGC/BIST test content via CPU L3 cache, one CPGC BIST engine per memory channel. We propose a cache based testing framework that speeds up test time 60?? to 170?? compared to JTAG or TAP based testing using the same test content. We will present the cache based test (CBT) architecture and infrastructure (MRC/NEM setup, CPGC/IBIST), test content, results, and a side by side comparison of test time to JTAG or TAP. Finally we will discuss and compare this approach to generalized cache based tests.