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Influence of structure defects of microchannel-plate-based X-ray optics on imaging performance

机译:微通道板基X射线光学器件结构缺陷对成像性能的影响

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The microchannel-plate-based x-ray optics is a spherical crown containing millions of square microchannels, reflecting the small incident angle light at a certain angle through the inner wall of the channels. Structure defects may exist in the square microchannel array. In this paper, the effects of structure defects on the imaging performance were studied through simulation and MPO preparation experiment. The structure defects involved in the paper include two types, chamfered channels and tilting channels. The experimental results are consistent with the simulation images, proving that the simulations are correct. The results show that the imaging of MPO with standard square channels array is a symmetrical cross. The presence of chamfers in corner of the channels results in a weak secondary small cross in the 45° direction of the obvious cross. For the case that the channels are tilted slightly, the center of the cross deviates from the imaging center, and the cross becomes an asymmetric cross. This study provides a theoretical guidance for precise control of array structures in the preparation of MPO.
机译:基于微通道板的X射线光学器件是包含数百万平方微通道的球冠,其通过通道的内壁反射一定角度的小入射角光。方形微通道阵列中可能存在结构缺陷。本文通过仿真和MPO制备实验研究了结构缺陷对成像性能的影响。本文涉及的结构缺陷包括两种类型,倒角通道和倾斜通道。实验结果与模拟图像一致,证明模拟是正确的。结果表明,带标准方形通道阵列的MPO的成像是一个对称的交叉。在通道的角落中的倒角的存在导致明显十字架的45°方向的弱二次小交叉。对于稍微倾斜通道的情况,交叉的中心偏离成像中心,并且交叉成为不对称的交叉。本研究提供了一种理论指导,可精确控制阵列结构在制备MPO时。

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