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Influence of Heat Treatment on Defect Structures in Single-Crystalline Blade Roots Studied by X-ray Topography and Positron Annihilation Lifetime Spectroscopy

机译：热处理对X射线地形和正电子湮灭寿命谱研究的单晶叶片根缺陷结构的影响

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Jacek Krawczyk; Włodzimierz Bogdanowicz; Aneta Hanc-Kuczkowska; Anna Tondos; Jan Sieniawski;
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1. Influence of Heat Treatment on Defect Structures in Single-Crystalline Blade Roots Studied by X-ray Topography and Positron Annihilation Lifetime Spectroscopy [J] . Krawczyk Jacek, Bogdanowicz Wlodzimierz, Hanc-Kuczkowska Aneta, Metallurgical and Materials Transactions, A. Physical Metallurgy and Materials Science . 2018,第9期

机译：热处理对X射线地形和正电子湮灭寿命谱研究的单晶叶片根缺陷结构的影响
2. Influence of Heat Treatment on Defect Structures in Single-Crystalline Blade Roots Studied by X-ray Topography and Positron Annihilation Lifetime Spectroscopy [J] . Krawczyk Jacek, Bogdanowicz Wlodzimierz, Hanc-Kuczkowska Aneta, Metallurgical and Materials Transactions, A. Physical Metallurgy and Materials Science . 2018,第9期

机译：热处理对X射线地形和正电子湮灭寿命谱研究的单晶叶片根缺陷结构的影响
3. Thermal stability of nanocrystalline Cu studied by positron annihilation lifetime spectroscopy and X-ray diffraction [J] . Kai Zhoua Hui Lia JinBiao Panga Zhu Wanga* Philosophical Magazine . 2012,第16期

机译：正电子ni没寿命谱和X射线衍射研究纳米晶铜的热稳定性
4. The Effect of Wheat Hay on Carbon Black Loaded EPDM Composite Studied by Positron Annihilation Lifetime Spectroscopy [C] . M. H. Abd-EI Salam, E. E. Abdel-Hady, Hamdy P. M. Mohamed, International Conference on Positron Annihilation . 2004

机译：小麦干草对正电子湮没寿命光谱研究的炭黑加载EPDM复合材料的影响
5. Surface modification of 6H-silicon carbide under vacuum annealing studied by time of flight positron annihilation induced auger electron spectroscopy . [D] . Mukherjee, Saurabh. 2007

机译：飞行时间正电子an灭诱导的俄歇电子能谱研究了真空退火下6H-碳化硅的表面改性。
6. Measurements of Defect Structures by Positron Annihilation Lifetime Spectroscopy of the Tellurite Glass 70TeO2-5XO-10P2O5-10ZnO-5PbF2 (X = Mg Bi2 Ti) Doped with Ions of the Rare Earth Element Er3+ [O] . K. Pach, J. Filipecki, E. Golis, 2017

机译：掺有稀土元素Er3 +的碲化物玻璃70TeO2-5XO-10P2O5-10ZnO-5PbF2（X = MgBi2Ti）的正电子ni没寿命光谱法测量缺陷结构
7. The evolution of vacancy-type defects in silicon-on-insulator structures studied by positron annihilation spectroscopy [O] . Coleman Paul G, Nash Deborah, Edwardson Charlene J, 2011

机译：用正电子an没光谱研究绝缘体上硅结构中空位型缺陷的演变
8. Point Defect Structures in Gallium Arsenide Studied by Positron Spectroscopies [R] . Saarinen, K. 1991

机译：砷化镓点缺陷结构的正电子谱研究

Influence of Heat Treatment on Defect Structures in Single-Crystalline Blade Roots Studied by X-ray Topography and Positron Annihilation Lifetime Spectroscopy

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