An evaluation and comparison of conducted emission test methods for Integrated Circuits

摘要

This paper presents a comparison of conducted emission test measurements. Traditional Line Impedance Stabilisation Network (LISN) conducted emission methods are compared with Integrated Circuits (IC) test methods including 1 Ω, direct and TEM cell methods. The frequency performance of each method is explored as well as performance above the present 30 MHz limit. Correlation of results of different methods explored through simulation results and measurements from a charge pump IC.