SEE Testing of National Semiconductor's LM98640QML System on a Chip for Focal Plane Arrays and Other Imaging Systems

摘要

National Semiconductor's LM98640QML is a complex signal processing solution interface for CCDs and CMOS imagers used in focal plane arrays and other imaging systems. This complex system on a chip (SOC) consists of an integrated 14 bit analog-to-digital converter (ADC), correlated double sampler, delay-locked loop (DLL), serial interface, digital-to-analog converters (DAC), programmable variable gain amplifiers and other components. Single event effect (SEE) characterization of a complex, precision SOC with many different operating modes can present significant challenges. Heavy ion test challenges, solutions and results are presented here.