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Slew rate improved 2×VDD output buffer using leakage and delay compensation

机译:利用泄漏和延迟补偿,斜率提高了2×VDD输出缓冲器

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A slew rate improved 2×VDD output buffer is proposed in the paper. By using the leakage compensation circuit, the gate oxide overstress at the output stage is avoided and the rising SR is improved. Besides, by using the Delay Buffer, the falling SR is improved by avoiding the PMOS and NMOS transistors turned on at the same time. The proposed design is carried out using a typical 90 nm CMOS process. After the leakage and delay compensation, the SR of the rising and falling edge of the output signal for VDDIO = 1.8 V is improved 27% and 22%, respectively. The maximum data rate is simulated to be 330/500 MHz for VDDIO = 1.8/1.0 V, respectively.
机译:本文提出了一种提高转换速率的2×VDD输出缓冲器。通过使用泄漏补偿电路,可以避免输出级的栅极氧化物过应力,并改善了上升的SR。此外,通过使用延迟缓冲器,避免了同时打开PMOS和NMOS晶体管,从而改善了下降的SR。建议的设计使用典型的90 nm CMOS工艺进行。经过泄漏和延迟补偿后,VDDIO = 1.8 V时输出信号上升沿和下降沿的SR分别提高了27%和22%。当VDDIO = 1.8 / 1.0 V时,最大数据速率模拟为330/500 MHz。

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