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Modeling electromagnetic radiation at high-density PCB/connector interfaces

机译:在高密度PCB /连接器接口处建模电磁辐射

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Electromagnetic radiation for a commercial printed circuit board (PCB) connector is investigated in this paper. The simulation models of the connector are shown to be validated by comparing measured and simulated S-parameters. Analytical formulas are provided to calculate the total loss and the radiated power from a PCB/connector structure when material losses are known. The total power loss for the considered geometry is shown to be dominated by material loss rather than radiated power loss. Termination schemes and additional geometry details in the connector model are also studied for their effects on the radiated power.
机译:本文研究了商用印刷电路板(PCB)连接器的电磁辐射。通过比较测得的和仿真的S参数,可以证明连接器的仿真模型得到了验证。当已知材料损耗时,可提供分析公式来计算总损耗和PCB /连接器结构的辐射功率。所考虑的几何形状的总功率损耗显示为材料损耗而不是辐射功率损耗。还研究了连接器模型中的端接方案和其他几何细节,以了解它们对辐射功率的影响。

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