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Study of a ~(10)B-based Multi-Blade detector for Neutron Scattering Science

机译:中子散射科学基于B基多刀片探测器的研究

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The main goal in neutron reflectometry instruments is to achieve a high angular resolution and high counting rates. Although ~3 He shortage affects scientific research in neutron scattering science due to its wide use in detectors as neutron converter; this is not the main issue for neutron reflectometry application where detector sizes are generally moderate. Indeed ~3 He detectors are instead limited in spatial resolution. To reduce the particles traces and thereby increase the spatial resolution those detectors are operated at high quencher gas pressure, resulting in mechanical constraints. A promising alternative, to accomplish these goals, is to exploit solid ~(10)B-films employed in a proportional gas chamber. The challenge with this technique is to attain a suitable detection efficiency. This can be achieved by operating the ~(10) B conversion layer at grazing angle relative to the incoming neutron direction. The Multi-Blade design is based on this operational principle and it is conceived to be modular in order to be adaptable to different applications. A prototype has been developed at ILL and the results obtained on our monochromatic test beam line are presented here. A significant concern in a modular design is the uniformity of detector response: several effects might contribute to degrade the uniformity and they have to be taken into account in the detector concept: overlap between different substrates, coating uniformity, substrate flatness, parallax errors, etc. A simulation has been developed to address these problems.
机译:中子反射仪器的主要目标是实现高角度分辨率和高计数率。虽然〜3他的短缺影响了中子散射科学的科学研究,因为它在探测器中广泛使用作为中子变换器;这不是中子反射率应用的主要问题,其中探测器尺寸一般是中等的。确实〜3 HE探测器在空间分辨率上被限制在空间分辨率中。为了减少颗粒迹线,从而增加空间分辨率,这些探测器在高猝灭剂气体压力下操作,导致机械约束。有前途的替代方案,以实现这些目标,是利用在比例气室中使用的固体〜(10)B膜。这种技术的挑战是达到合适的检测效率。这可以通过在相对于进入中子方向上操作〜(10)B转换层来实现。多刀片设计基于该操作原理,并且构思是模块化的,以便适应不同的应用。生病已经开发了一种原型,在此提出了在我们的单色测试梁线上获得的结果。模块化设计中的一个重要问题是探测器响应的均匀性:有几个效果可能有助于降低均匀性,并且必须在探测器概念中考虑它们:在不同的基板之间重叠,涂层均匀性,基板平整度,视差误差,等。已经开发了一种模拟来解决这些问题。

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