Evolution of Cr4+, Cr3+ and Cr2+ contents in Cr:Mg2SiO4 crystals during those oxidizing annealing

摘要

The evolution of Cr4+, Cr3+ and Cr2+ contents in Cr:Mg2SiO4 crystals during those prolonged high-temperature oxidizing annealing have been studied. The concentration of Cr4+ increases by factor of 1, 5-2, 5, whereas the parasitic Cr2+ ions practically disappear during such annealing. Therefore this post-growth treatment of Cr:Mg2SiO4 crystals considerably enhances their spectroscopic properties as the active laser media.