Sensitivity analysis of Wiener filter-based synthetic aperture radar (SAR) microwave imaging technique

摘要

Previously, a Wiener filter-based synthetic aperture radar (SAR) technique was developed to successfully image embedded objects in a general layered structure. The results of the imaging technique were then verified through performing extensive measurements. Here, the sensitivity of this technique to different critical parameters is investigated using a full-wave electromagnetic simulation software. These parameters include those related to the sample being imaged (e.g., electrical properties of layers), those related to measurements (e.g., electromagnetic wave polarization), and those associated with the modeling process (e.g., electrical properties of layers used in the image reconstruction procedure).