An automated Test Set-up for the dynamic Characterization of IGBT Modules under different thermal and electrical Conditions

摘要

A fully automated test set-up is introduced, which permits the measurement of the terminal characteristics of an IGBT module (Insulated Gate Bipolar Transistor module) under different thermal and electrical conditions. Both the transients of the IGBT and the freewheeling diode are investigated separately. Additionally, a generic basic macro model of an IGBT module, which is already implemented in the system simulator Portunus~®, has been validated.