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Optical properties of copper oxide thin films as selective sensing principle for hydrogen sulflde detection

机译:铜氧化铜薄膜的光学性质作为氢硫型检测的选择性传感原理

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Semiconducting cuprous (Cu_2O) and cupric oxide (CuO) have been subject to intense research efforts, mainly because of the materials' potential for photovoltaic applications and as doping material. In this work, the impact of hydrogen sulfide (H_2S) exposure on thin film samples of CuO and Cu_2O has been investigated, focusing on alterations in the optical properties. The materials composition was verified using Raman spectroscopy. The samples were exposed to well-defined dosages of H_2S and the transmission and reflection characteristics in the expanded UV/Vis regime (350-1100 run) were recorded. Cu_2O films showed an explicit increase in transmissivity for the wavelength region 1 = 550-900 nm, besides a general decrease in reflectivity of all samples within the considered spectral range. Optical band gaps were determined using Tauc's plotting, revealing a shift in the slope of a2 of CuO after gas exposure. The observed effects can be exploited as sensing effect, which was examined in a thin film total-internal-reflection (TIR) set-up to transiently monitor surface-gas interactions, yielding reproducible changes in response to 20 min exposure to5 ppm H_2S.
机译:半导体亚克铜(Cu_2O)和铜氧化铜(CUO)一直受到激烈的研究努力,主要是因为光伏应用的材料和掺杂材料。在这项工作中,研究了硫化氢(H_2S)暴露对CuO和Cu_2O薄膜样品的影响,专注于光学性质的改变。使用拉曼光谱验证材料组合物。将样品暴露于明确定义的H_2S剂量,并记录扩展的UV / VIS制度(350-1100运行)中的透射和反射特性。除了所考虑的光谱范围内所有样品的反射率的一般降低,Cu_2O薄膜显示出对波长区域1 = 550-900nm的透射率的显着增加。使用Tauc的绘图测定光带间隙,在气体暴露后露出CuO的A2斜率的偏移。观察到的效果可以作为感测效果被利用,其在薄膜全内反射(TIR)设置为瞬时监测表面气相中,响应于20分钟暴露于5 ppm H_2s,产生可重复的变化。

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