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Soil Parameter Estimation and Analysis of Bistatic Scattering X-Band Controlled Measurements

机译:黑晶散射X波段控制测量土壤参数估计与分析

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in this paper, we will present well controlled experimental bistatic X-band measurements of rough surfaces, which have been recorded in the Bistatic Measurement Facility (BMF) at the DLR Oberpfaffenhofen, Microwaves and Radar Institute. The bistatic measurement sets are composed of soils with different statistical roughness and different moistures controlled by a TDR (Time Domain Reflectivity) system. The BMF has been calibrated using the Isolated Antenna Calibration Technique (IACT). The validation of the calibration was achieved by measuring the reflectivity of fresh water. In the second part, the first validation of the specular algorithm by estimating the soil moisture of two surfaces with different roughness scales will be reported. Additionally, a new technique using the coherent term of the Integral Equation Method (IEM) to estimate the soil roughness will be presented, as well as evaluation of the sensitivity of phase and reflectivity with regard to moisture variation in the specular direction.
机译:在本文中,我们将提出的粗糙表面,其已经记录在双站测量设施(BMF)在DLR奥伯法芬霍芬,微波炉和雷达研究所很好的控制实验双基X波段测量。双基测量集由具有不同统计粗糙度和通过TDR(时域反射率)系统控制的不同水分污垢。该BMF已经使用分离的天线校准技术(IACT)校准。校准的验证通过测量新鲜水的反射率来实现的。在第二部分中,将被报告通过估计两个表面具有不同的粗糙度鳞片土壤湿度镜面算法的第一验证。另外,使用积分方程法(IEM)的相干项来估计土壤粗糙度的新技术将被呈现,以及相位和反射率相对于水分变化镜面方向的灵敏度的评价。

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