A Complete Sensor Model for Miniscopic Electrical Impedance Tomography

摘要

Electrical impedance tomography (EIT) is a promising non-destructive testing technique to image the conductivity distribution within a closed domain. Due to its advantages of non-radiation, low-cost and high temporal resolution, EIT owns many potential industrial and biological applications. To improve the application of EIT on observing mini-scale objects, a miniature EIT sensor is developed, as well as a Complete Sensor Model (CSM). The CSM has a good similarity with the actual sensor structure. As a result, the model errors are reduced. According to the numerical and experimental results, the CSM is helpful for enhancing the homogeneity of EIT sensitivity field, and thus improve the image reconstruction accuracy.