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An EEG artifact detection and removal technique for embedded processors

机译:嵌入式处理器的EEG工件检测和拆卸技术

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Neurophysiological signals such as Electroencephalogram (EEG) can be used in a variety of purposes including detecting fatigue, stress, brain disorders, brain-computer interfaces (BCIs), or building better models of human variability and human brain. However, EEG signal is frequently defiled with other electrical sources not related to brain activity. These artifacts may emerge from external sources such as eye blinks, muscle & head movement, and power lines. Existing techniques for removing artifacts such as independent component analysis (ICA) are highly computationally intensive and need to process data offline due in large part to the highly volatile, non-stationary nature of the brain signals, especially in natural, noise-ridden environments.
机译:诸如脑电图(EEG)的神经生理信号可用于各种目的,包括检测疲劳,应力,脑疾病,脑电脑界面(BCI),或建立更好的人类变异和人脑模型。然而,EEG信号经常与与大脑活动无关的其他电源污染。这些工件可以从外部来源中出现,例如眼睛闪烁,肌肉和头部运动和电力线。用于去除诸如独立分量分析(ICA)之类的工件的现有技术是高度计算密集的,并且需要在大部分到高挥发性,非稳定性的大脑信号的高挥发性,非静止性质的情况下处理数据,特别是在自然,噪声横跨环境中。

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