首页> 外文会议>IEEE East-West Design Test Symposium >Analysis of error-detection possibilities of CED circuits based on Hamming and Berger codes
【24h】

Analysis of error-detection possibilities of CED circuits based on Hamming and Berger codes

机译:基于汉明和伯杰码的CED电路错误检测可能性分析

获取原文

摘要

Features of Berger and Hamming codes application in testable logical devices synthesis are described in this paper. Some new error-detection properties of these codes are determined; this is actual for concurrent error detection (CED) systems. Codes' properties are compared and Hamming code CED system check equipment synthesis method is described on the example of code with 4 informational bits checker design. Berger and Hamming codes' checkers are compared.
机译:本文介绍了Berger和Hamming代码在可测试逻辑设备综合中的应用特点。确定了这些代码的一些新的错误检测属性。这对于并发错误检测(CED)系统是实际的。比较了代码的属性,并以具有4个信息位检查器设计的代码示例为例,介绍了汉明代码CED系统检查设备综合方法。比较Berger和Hamming码的检查器。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号