首页> 外文会议>Symposium on VLSI Circuits >A Heterogeneous Dual DLL and Quantization error minimized ZQ calibration for 30nm 1.2V 4Gb 3.2Gb/s/pin DDR4 SDRAM
【24h】

A Heterogeneous Dual DLL and Quantization error minimized ZQ calibration for 30nm 1.2V 4Gb 3.2Gb/s/pin DDR4 SDRAM

机译:异构双DLL和量化误差最大程度地降低了针对30nm 1.2V 4Gb 3.2Gb / s / pin DDR4 SDRAM的ZQ校准

获取原文

摘要

This paper describes DLL architecture and ZQ calibration method for 30nm 1.2V 4Gb 3.2Gb/s/pin DDR4 SDRAM. Proposed DLL consists of one DLL with CML DCDL and another DLL with CMOS DCDL which tracks first one for low jitter and low power characteristics. Quantization error minimized (QEM) ZQ calibration is proposed for better signal integrity and yield improvement. The implemented DLL dissipates 6.5mW from a 1.2-V supply. Output jitter is 2.99 psrms with all high data, single bank read pattern and 7.75 psrms with random data, all bank interleaved read pattern. Despite 100 times of ZQ calibration, measured mismatch between pull up and pull down (MMPuPd) over all DQs is under 2 %.
机译:本文介绍了30nm 1.2V 4Gb 3.2Gb / s / pin DDR4 SDRAM的DLL体系结构和ZQ校准方法。提议的DLL由一个带有CML DCDL的DLL和另一个带有CMOS DCDL的DLL组成,该DLL跟踪第一个DLL具有低抖动和低功耗特性。提出了最小化量化误差(QEM)的ZQ校准,以实现更好的信号完整性和良率提高。所实现的DLL在1.2V电源下的功耗为6.5mW。在所有高数据,单存储体读取模式下,输出抖动为2.99 ps rms ;对于随机数据,所有存储体交错读模式,输出抖动为7.75 ps rms 。尽管进行了100次ZQ校准,但在所有DQ上测得的上拉和下拉(MMPuPd)之间的失配均低于2%。

著录项

相似文献

  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号