SLICED: Slide-based concurrent error detection technique for symmetric block ciphers

摘要

Fault attacks, wherein faults are deliberately injected into cryptographic devices, can compromise their security. Moreover, in the emerging nanometer regime of VLSI, accidental faults will occur at very high rates. While straightforward hardware redundancy based concurrent error detection (CED) can detect transient and permanent faults, it entails 100% area overhead. On the other hand, time redundancy based CED can only detect transient faults with minimum area overhead but entails 100% time overhead. In this paper we present a general time redundancy based CED technique called SLICED for pipelined implementations of symmetric block cipher. SLICED SLIdes one encryption over another and compares their results for CED as a basis for protection against accidental faults and deliberate fault attacks.