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An Anti-Overcharged High-dV/dt-Immunity Capacitive Level Shifter With Dynamic Discharge Control for Half-Bridge GaN Driver

机译:半桥GaN驱动器具有动态放电控制的防过充电的高DV / DT-IMP电容电平移位器

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This paper presents an anti-overcharged high-dV/dt-immunity capacitive level shifter with dynamic discharge control (DDC) for half-bridge GaN driver. The DDC prevents overcharge of the floating power supply capacitor during high negative dV/dt transitions and is suitable for a wide variation range of negative dV/dt transitions of floating power supply. Moreover, a fault-logic blanking block is introduced to guarantee the robust of output logic during ultra-high dV/dt transitions. The proposed Level shifter is fabricated in a 0.18-µm BCD process and occupies an active chip area of 0.034mm2. Simulation results demonstrate that the propagation delay is less than 0.8ns at 50V level shifting and keeps almost constant when the floating ground ranges from -3V to 50V. The positive dV/dt immunity is 300V/ns. The negative dV/dt is 170V/ns under the condition that the level shifting capacitor does not discharge to floating power supply.
机译:本文介绍了具有用于半桥GaN驱动器的动态放电控制(DDC)的抗过度充电的高DV / DT-IMMITY电平移位器。 DDC在高负DV / DT转换期间防止浮动电源电容器的过充电,并且适用于浮动电源的宽变化范围的负面DV / DT转换。此外,引入了故障逻辑消隐块以保证超高DV / DT转换期间输出逻辑的稳健。所提出的水平移位器在0.18-μm的BCD工艺中制造,占据0.034mm的有源芯片面积 2 。仿真结果表明,在50V水平移位的情况下,传播延迟小于0.8ns,并且当浮动接地范围为-3V至50V时,几乎恒定。阳性DV / DT免疫为300V / NS。负DV / DT是170V / NS,条件下电平移位电容器不会向浮动电源放电。

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