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Detection and characterisation of defects in highly scattering materials using ultrasonic arrays

机译:超声阵列的高度散射材料缺陷检测与表征

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Coarse grained materials are widely used in the power generation industry and their inspection is critical for the safe operation of nuclear power plants. Ultrasonic array imaging is an important non-destructive testing method which is capable of detecting and characterising defects in a component. However, the performance of ultrasonic inspection can be severely affected by the existence of grains in a polycrystalline material which cause ultrasonic attenuation and backscatter. In this paper, we aim to explore the effect of two important parameters, frequency and inspection depth, on the characterisation accuracy of small side-drilled holes through experiments. The average grain size of the Inconel specimen is 750μm, and 2mm holes (in diameter) are found to be detectable when the frequency does not exceed 2 MHz even at large distances from the array (i.e. 60mm). Moreover, it is shown that reliable sizing of these small holes is achievable using the scattering matrix.
机译:粗粒材料广泛用于发电行业,他们的检查对于核电厂的安全运行至关重要。超声阵列成像是一种重要的非破坏性测试方法,其能够检测和表征组件中的缺陷。然而,超声检查的性能可能严重影响多晶材料中的谷物的存在,这导致超声波衰减和反向散射。在本文中,我们的目标是通过实验探讨两个重要参数,频率和检查深度的效果,频率和检测深度。当频率不超过2MHz时,即使在阵列的大距离(即60mm)的大距距离,当频率不超过2MHz时,即使频率不超过2MHz,也可以检测到750μm的平均粒度为750μm,并且可以检测到2mm孔(直径)。此外,示出了使用散射矩阵可实现这些小孔的可靠尺寸。

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