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THE IPC-B-52 SIR TEST VEHICLE: A DISCUSSION OF THE CURRENT TEST VEHICLE DESIGN AND POSSIBLE MODIFICATIONS FOR THE FUTURE

机译:IPC-B-52 SIR测试车辆:目前测试车辆设计和未来可能的修改的讨论

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For many decades now, electronic hardware manufacturers have desired soldering chemistries that provide reliable interconnects. While the use of flux is essential to create proper solder joints, it is well known that residues left behind can have a negative impact on reliability caused by either electrochemical migration or by corrosion failure mechanisms. As assembly complexity has increased, it is common to have multiple flux chemistries on the same assembly. These fluxes often come from multiple manufacturers and in many instances they come into contact with one another resulting in flux mixtures. The IPC-B-24 coupon has traditionally been the electronics industry's primary test vehicle (TV) for evaluating flux chemistries and surface insulation resistance (SIR) as it provides a quick and easy way to evaluate individual fluxes as well as mixing effects. Although useful, this design is not an ideal test vehicle for assembly manufacturers to evaluate fluxes using actual production equipment and assembly processes, as it consists of only single sided surface traces, without surface mounted or wave soldered components. This shortcoming, over the years, has driven the development of various company unique SIR test vehicles. Recognizing that the IPC-B-24 coupon was not ideal for all reliability evaluations, the IPC-B-52 test vehicle was designed. It is much more capable of assessing SIR concerns with flux chemistry that result from the presence of components. As the industry continues to migrate to lead free soldering for higher complexity hardware assemblies, and new flux chemistries are introduced, it is projected that the adoption and usage of the new IPC-B-52 coupon will continue to rise. The intent of this paper is to share IBM's latest experience and recommendations when using the IPC-B-52 design helping to drive a common SIR test vehicle that can be adopted for widespread implementation, reducing the need for company specific designs, and minimizing replicate testing resources. This paper discusses the following: 1. A list of lessons learned that would be helpful to those who are considering using the IPC-B-52 design 2. Further enhancements, including component additions and card design features, that would further enhance the test vehicle's ability to address the challenges of today's complex assemblies
机译:几十年来,电子硬件制造商一直期望提供可靠互连的焊接化学。尽管必须使用助焊剂才能形成适当的焊点,但众所周知,残留的残留物可能会对电化学迁移或腐蚀失效机制造成的可靠性产生负面影响。随着组装复杂度的增加,通常在同一组装上具有多个助焊剂化学成分。这些助焊剂通常来自多个制造商,在许多情况下,它们彼此接触,形成助焊剂混合物。 IPC-B-24试样传统上一直是电子行业用于评估助焊剂化学性质和表面绝缘电阻(SIR)的主要测试工具(TV),因为它提供了一种快速简便的方法来评估单个助焊剂以及混合效果。尽管有用,但这种设计对于装配制造商来说,并不是使用实际生产设备和装配过程评估助焊剂的理想测试工具,因为它仅由单面表面走线组成,而没有表面安装或波峰焊接组件。多年来,这种缺陷推动了公司各种独特的SIR测试工具的发展。认识到IPC-B-24试样并不是所有可靠性评估的理想选择,因此设计了IPC-B-52测试车辆。它更能够评估由于组分的存在而引起的助焊剂化学性质对SIR的关注。随着行业继续向无铅焊接领域发展,以实现更高复杂性的硬件组件,并且引入了新的助焊剂化学成分,预计新IPC-B-52试样的采用和使用将继续增加。本文的目的是在使用IPC-B-52设计时分享IBM的最新经验和建议,该设计有助于驾驶可广泛采用的通用SIR测试工具,减少对公司特定设计的需求,并最大程度地减少重复测试资源。本文讨论以下内容:1.总结经验教训,对那些正在考虑使用IPC-B-52设计的人有所帮助。2.进一步的增强,包括组件添加和卡设计功能,将进一步增强测试车辆的性能。应对当今复杂装配挑战的能力

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