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Silicon carbide based instrumentation amplifiers for extreme applications

机译:基于碳化硅的仪器仪表放大器,用于极端应用

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While instrumentation amplifiers based on silicon technology have revolutionized our understanding of the world in which we live, they are limited to operating in benign environments. This limitation precludes their use in a wide range of industrial, automotive and geological applications, where the required operating temperatures can exceed 200°C. Silicon-on-insulator technology has enabled the development of high temperature electronics, however applications requiring higher temperature operation are becoming apparent. In this work, we present the integration of JFET structures to demonstrate high gain amplifier circuits capable of operating at temperatures up to 400C. The circuit design is supported by the realisation of a novel JFET compact model, which enables a greater level of confidence than existing models in the literature. The experimental open loop gain of a two stage differential amplifier is 45dB at room temperature and this equates to a sensitivity of 55mV/°C for a Pt100 thermometer, which is sufficient for the monitoring of a range of industrial processes.
机译:虽然基于硅技术的仪表放大器彻底改变了我们对我们生活的世界的理解,但它们仅限于在良性环境中运行。这种限制妨碍了它们在各种工业,汽车和地质应用中的应用,其中所需的工作温度可能超过200°C。绝缘体技术支持高温电子的开发,但需要更高温度操作的应用变得显而易见。在这项工作中,我们介绍了JFET结构的集成,以展示能够在高达400℃的温度下操作的高增益放大器电路。通过实现新型JFET紧凑型模型来支持电路设计,其能够比文献中的现有模型更大的置信度。在室温下,两个阶段差分放大器的实验开环增益是45dB,这相当于PT100温度计的55mV /℃的灵敏度,这足以监测一系列工业过程。

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