Ptychography: A novel phase retrieval technique, advantages and its application

摘要

This paper is intended to introduce ptychography, a novel and very promising phase retrieval technique. It is based on the lens-less recording of a series of diffraction patterns caused by coherent object illumination. In the visible region of light, ptychography has successfully been implemented for visible light microscopy and optical metrology. Ptychography has also successfully been applied to X-ray microscopy where it is difficult to manufacture good quality lenses and where, at high X-ray energies, absorption contrast is low but where phase contrast is significant. In the course of this paper theoretical fundamentals of ptychography are explained, advantages in comparison to traditional optical techniques are represented and applications are shown.