Static test compaction for delay fault test sets consisting of broadside and skewed-load tests

摘要

Test sets that consist of both broadside and skewed-load tests provide improved delay fault coverage for standard-scan circuits. This paper describes a static test compaction procedure for such mixed test sets. The unique feature of the procedure is that it can modify the type of a test (from broadside to skewed-load or from skewed-load to broadside) if this contributes to test compaction. Experimental results demonstrate that the procedure is able to reduce the sizes of available mixed test sets significantly. Moreover, it modifies the types of significant numbers of tests before including them in the compacted test set.