Intelligent diagnostics of devices with the use of infrared mapping images

摘要

A correct diagnostics together with the early prediction of failure or malfunction of the system are the major issues in modern maintenance. Nowadays, the time-honored diagnostics may be inadequate and lead to omitting failures, resulting in higher costs of repairing damaged equipment. That is why the interest in intelligent diagnostics increases due to the possibility of better interpretation of the component status and early failure prediction. One of the ways of determining the device condition is to measure and analyze the temperature of multiple points on the device. Thermographics may show a beginning of significant wear of a component, and enable a repair or replacing before the failure appears. The paper presents the key aspects of the diagnostics with thermal images, including: technology mapping, mapping algorithms, together with a presentation of available software solutions.