The Application of Least Square Method in the Automatic Monitoring Device of Wheel-set Magnetic Testing Machine

摘要

In the process of applying wheel-set magnetic testing machine,testing results are easily influenced by the parameter variation.Parameter variation mainly happens with the variation of the strength of magnetizing current,UV-light for leakage magnetic field,and white light.In order to avoid the influence of magnetic powder on KLS,detector is not put on the objects.Digital curve is worked out according to the data based on Least Square Method and non-touch inspection is achieved.This paper,based on Last Square Method,does a research on MCU,and investigates the development method of automatic monitoring devices,MCU's multipath collecting of weak signals,and data communication of computer.