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On-chip debug architecture for MCU-DSP Core based system-on-chip

机译:基于MCU-DSP Core的片上系统的片上调试架构

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The migration from system on printed circuit boards (PCBs) to system-on-chips (SoCs) has moved more and more components onto SoCs. An unintended side effect of this higher integration level is the decreasing system observability and controllability, and consequently resulting in novel debug challenges for embedded system development [1]. This paper presents an on-chip debug architecture that can help conquer the challenges. The on-chip debug architecture is integrated into the 32-bit static superscalar MCU-DSP Core based SoC and includes three main components: the JTAG Controller, the On-chip Debug Module and the Core Debug Module. This modular architecture can support the following typical debug features with low hardware overhead: real-time run control, access internal registers and local memory on the fly, complex hardware breakpoints and single-stepping.
机译:从印刷电路板(PCB)的系统到片上系统(SoC)的迁移已将越来越多的组件移至SoC上。这种更高集成度的意外副作用是降低了系统的可观察性和可控制性,因此给嵌入式系统开发带来了新的调试挑战[1]。本文提出了一种可以帮助克服挑战的片上调试架构。片上调试架构已集成到基于32位静态超标量MCU-DSP内核的SoC中,并包括三个主要组件:JTAG控制器,片上调试模块和内核调试模块。这种模块化体系结构可以以较低的硬件开销支持以下典型的调试功能:实时运行控制,动态访问内部寄存器和本地内存,复杂的硬件断点和单步执行。

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