Investigation of Low Cross Section Events in the RHBD/FT UT699 Leon 3FT

摘要

The Aeroflex UT699 LEON 3FT RHBD microprocessor was tested for SEE. Testing showed the UT699 is sensitive to a register SEE above LET = 10 MeV-cm^2/mg which is of limited impact due to a space rate of approximately 5E-6/device-year. This is on the same order of magnitude with earlier SEE rates predicted from FF upsets. Results were also collected for SpaceWire ports, Watchdog circuitry, SRAM elements (including L1 instruction, L1 data caches), and other potential disruptive events where the processor response could range from error mode to kernel or user thread killing to silent passing of bad data.