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Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

机译：RadHard器件迁移到备用晶圆厂的重离子单事件影响性能

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Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.

机译：Aerofab通过在工厂关闭或不可用时将RadHard器件迁移到备用晶圆厂，减轻了IC零件报废的担忧。提供了针对最近迁移的设备的比较辐射性能数据。

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《2011 IEEE Radiation Effects Data Workshop》|2011年|p.1-8|共8页
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Hafer Craig; Lahey Mike; Harris Debra; Larsen Jennifer; Sievert Fred; Sims Tony; Meyer Steve; Dumitru Radu; Jordan Anthony; Milliken Peter;
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Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

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