首页> 外文会议>2011 IEEE AUTOTESTCON >BIT/BITE/ED/EP/IVHM and ATE in DA
【24h】

BIT/BITE/ED/EP/IVHM and ATE in DA

机译:DA中的BIT / BITE / ED / EP / IVHM和ATE

获取原文

摘要

Automatic test equipment (ATE) in the Department of the Army (DA) finds itself in an ever challenging and changing role in an effort to support the Future Force of the 21st century. Challenging in that the ATE today must combat obsolescence while supporting both the legacy and future systems; and changing in that Army Transformation is transitioning from four (4) to two (2) levels of maintenance support. Advances in technology in the areas of built-in-test (BIT), built-in-test equipment (BITE), embedded diagnostics (ED), embedded prognostics (EP) and integrated vehicle health management (IHVM) have been the primary enablers allowing the DA to make major changes in maintenance, test philosophy and logistics in order to reduce cost, schedule and time. BIT/BITE/ED/EP/IVHM and ATE complement one another and each play a valuable and vital role in the maintenance and logistics support of the Future Force.
机译:陆军部(DA)的自动测试设备(ATE)处于不断挑战和变化中的角色,以支持21世纪的未来力量。具有挑战性的是,当今的ATE必须在支持旧有系统和未来系统的同时抵制过时;而变化在于,陆军转型将从四(4)到两(2)级别的维护支持过渡。内置测试(BIT),内置测试设备(BITE),嵌入式诊断(ED),嵌入式预测(EP)和集成车辆健康管理(IHVM)领域的技术进步是主要推动力使DA可以在维护,测试原理和后勤方面进行重大更改,以减少成本,进度和时间。 BIT / BITE / ED / EP / IVHM和ATE互为补充,在未来部队的维护和后勤支持中均发挥着宝贵而至关重要的作用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号