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Improvements in the EQ-10 Electrodeless Z-Pinch EUV Source for Metrology Applications

机译:用于计量应用的EQ-10无电极Z夹EUV光源的改进

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Now that EUV lithography systems are beginning to ship into the fabs for next generation chips it is more critical that the EUV infrastructure developments are keeping pace. Energetiq Technology has been shipping the EQ-10 Electrodeless Z-pinch™ light source since 2005. The source is currently being used for metrology, mask inspection, and resist development. These applications require especially stable performance in both power and source size. Over the last 5 years Energetiq has made many source modifications which have included better thermal management as well as high pulse rate operation6. Recently we have further increased the system power handling and electrical pulse reproducibility. The impact of these modifications on source performance will be reported.
机译:现在,EUV光刻系统已开始用于下一代芯片的晶圆厂中,因此至关重要的是,EUV基础设施的发展必须与时俱进。自2005年以来,Energetiq Technology一直在运送EQ-10无电极Z-pinch™光源。该光源目前用于度量衡,掩模检查和抗蚀剂显影。这些应用要求功率和源尺寸都特别稳定。在过去的5年中,Energetiq进行了许多源修改,包括更好的热管理以及高脉冲速率操作6。最近,我们进一步提高了系统的功率处理能力和电脉冲再现性。将报告这些修改对源性能的影响。

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