With a goal to investigate possible anisotropic dielectric properties in layered multiferroic oxides, infrared reflection measurement was used to measure dielectric constants inside the a-b lane of highly c-oriented double layered Bi_2FeCrO_6 thin film, and the results were compared to that from highly c-oriented BiFeO_3 thin film. The dielectric spectra were identified according to optical phonons, and the areas with negative permittivity were analyzed. The preliminary effort will actually lead to a very interesting area of finding new photonic materials for efficiently controlling EM waves.
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