首页> 外文会议>International conference on image processing and pattern recognition in industrial engineering;IPPRIE 2010 >Measuring optics' surface information with digital image processing technology
【24h】

Measuring optics' surface information with digital image processing technology

机译:利用数字图像处理技术测量光学元件的表面信息

获取原文

摘要

The quality of optics' surface is of an important character which has critical influence in optical system. There are many ways to detect surface quality, but interferometry is considered as an effective technology. Interfere fringes which obtained from our experiment based on equal thickness interference were processed with digital image processing (DIP) technology in this paper. Image smoothing, fringes thinning, fringes' space measurement and P-V value measurement were done in this processing, Which can give optics' surface information automatically and accurately. We measured some optics whose apertures are not more than 30mm, and the result is satisfactory. Our method will be widely used in industrial inspection, especially in optical works in the future.
机译:光学元件的表面质量是一个重要的特性,它对光学系统具有至关重要的影响。有许多方法可以检测表面质量,但是干涉测量法被认为是一种有效的技术。本文采用数字图像处理(DIP)技术对基于等厚干涉的实验条纹进行了处理。在该过程中完成了图像平滑,条纹细化,条纹空间测量和P-V值测量,可以自动,准确地提供光学元件的表面信息。我们测量了一些孔径不超过30mm的光学元件,结果令人满意。我们的方法将被广泛用于工业检查,尤其是将来的光学工程。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号