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An 8-bit, two-step embedded ADC for a SiPM read-out chip

机译:用于SiPM读出芯片的8位,两步嵌入式ADC

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An 8-bit Analog-to-Digital Converter (ADC), suitable to be integrated in multi-channel ASICs for the read-out of SiPM arrays, has been designed in a standard 0.35mm CMOS process. The circuit implements two 8-bit interleaved ADCs with a two-step flash architecture. Each ADC has a sub-ranging mode of operation, and the overall frequency of conversion is of 20MHz. Clock boosting techniques have been exploited to improve the performance of the transmission gates used as switches and a pre-coarse conversion phase has been introduced to improve the conversion accuracy for signals close to the limits of the input dynamic range. Much care has been devoted to the design of the resistor ladder used to generate the voltage references for the comparators. In particular a statistical approach has been adopted to optimize the standard deviations of the voltage references due to resistor mismatch. A test chip containing a prototype of the ADC has been manufactured and the first characterization measurements are here presented and discussed.
机译:已经采用标准的0.35mm CMOS工艺设计了一个8位模数转换器(ADC),该模数转换器适合集成在多通道ASIC中以读取SiPM阵列。该电路实现了两个具有两步闪存架构的8位交错ADC。每个ADC都有一个子范围的工作模式,转换的总频率为20MHz。已经利用时钟增强技术来改善用作开关的传输门的性能,并且引入了预粗转换阶段来提高接近输入动态范围限制的信号的转换精度。对于用于为比较器生成参考电压的梯形电阻器的设计已经非常注意。特别地,已经采用统计方法来优化由于电阻器不匹配而引起的电压基准的标准偏差。已制造出包含ADC原型的测试芯片,并在此介绍和讨论了首次表征测量。

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