We have developed a precise energy-resolved X-ray imaging method using the counting-type pixel detector, PILATUS. X-ray intensities were recorded as a scan of the threshold energies and its energy was determined with the s-curve fitting analysis. Laue diffraction patterns of a silicon steel sample were measured with white X-ray beams at BL28B2 of SPring-8. A grain image of silicon steel was obtained with a sample position scan. The reflected X-ray energies were determined at three sample positions to analyze the lattice constant in the sample crystal grain.
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