Energy-resolved X-ray imaging method with a counting-type pixel detector

摘要

We have developed an energy-resolved X-ray imaging method using the counting-type pixel detector PILATUS-100K. X-ray intensities were recorded as a scan of threshold energies, and the X-ray energy was determined by an s-curve fitting analysis. As a capability study of ultra precise energy-resolved imaging, X-ray beam intensities at 15.75, 15.76,15.77,15.78,15.79, and 15.80 keV were measured and their threshold scan distributions could be clearly separated from each other. Laue diffraction patterns of a silicon steel sample were recorded with white X-ray beams. A grain image of silicon steel was obtained with a sample position scan. The reflected X-ray energy was also measured at three sample positions to analyze the lattice constant of the sample crystal grain.